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Proceedings Paper

The image enhancement and region of interest extraction of lobster-eye X-ray dangerous material inspection system
Author(s): Qi Zhan; Xin Wang; Baozhong Mu; Jie Xu; Qing Xie; Yaran Li; Yifan Chen; Yanan He
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Paper Abstract

Dangerous materials inspection is an important technique to confirm dangerous materials crimes. It has significant impact on the prohibition of dangerous materials-related crimes and the spread of dangerous materials. Lobster-Eye Optical Imaging System is a kind of dangerous materials detection device which mainly takes advantage of backscatter X-ray. The strength of the system is its applicability to access only one side of an object, and to detect dangerous materials without disturbing the surroundings of the target material.

The device uses Compton scattered x-rays to create computerized outlines of suspected objects during security detection process. Due to the grid structure of the bionic object glass, which imitate the eye of a lobster, grids contribute to the main image noise during the imaging process. At the same time, when used to inspect structured or dense materials, the image is plagued by superposition artifacts and limited by attenuation and noise. With the goal of achieving high quality images which could be used for dangerous materials detection and further analysis, we developed effective image process methods applied to the system. The first aspect of the image process is the denoising and enhancing edge contrast process, during the process, we apply deconvolution algorithm to remove the grids and other noises. After image processing, we achieve high signal-to-noise ratio image. The second part is to reconstruct image from low dose X-ray exposure condition. We developed a kind of interpolation method to achieve the goal. The last aspect is the region of interest (ROI) extraction process, which could be used to help identifying dangerous materials mixed with complex backgrounds. The methods demonstrated in the paper have the potential to improve the sensitivity and quality of x-ray backscatter system imaging.

Paper Details

Date Published: 24 October 2016
PDF: 7 pages
Proc. SPIE 9995, Optics and Photonics for Counterterrorism, Crime Fighting, and Defence XII, 99950Y (24 October 2016); doi: 10.1117/12.2242016
Show Author Affiliations
Qi Zhan, Key Lab. of Advanced Mirco-Structured Materials (China)
Tongji Univ. (China)
Xin Wang, Key Lab. of Advanced Mirco-Structured Materials (China)
Tongji Univ. (China)
Baozhong Mu, Key Lab. of Advanced Mirco-Structured Materials (China)
Tongji Univ. (China)
Jie Xu, Key Lab. of Advanced Mirco-Structured Materials (China)
Tongji Univ. (China)
Qing Xie, Key Lab. of Advanced Mirco-Structured Materials (China)
Tongji Univ. (China)
Yaran Li, Key Lab. of Advanced Mirco-Structured Materials (China)
Tongji Univ. (China)
Yifan Chen, Key Lab. of Advanced Mirco-Structured Materials (China)
Tongji Univ. (China)
Yanan He, Key Lab. of Advanced Mirco-Structured Materials (China)
Tongji Univ. (China)


Published in SPIE Proceedings Vol. 9995:
Optics and Photonics for Counterterrorism, Crime Fighting, and Defence XII
Douglas Burgess; Gari Owen; Henri Bouma; Felicity Carlysle-Davies; Robert James Stokes; Yitzhak Yitzhaky, Editor(s)

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