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Proceedings Paper

Measurement of scattering laser energy density distribution in optical extinctive chambers based on CCD imaging method
Author(s): Weiwei Liang; Wenpan Zhang; Qianrong Cheng; Yongwang Hao; Hongpeng Zhao
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Paper Abstract

The CCD imaging method is usually used in the far-field laser energy density distribution measurement, and the method is simple, reliable. The scattering laser energy density distribution in optical extinctive chambers is one of the most important factors affecting the performance of hardware-in-the-loop simulation system for laser guided weapon because of the weak signal, therefore, how to accurately measure the scattering laser energy density distribution is the key factor to the performance of the laser guided weapon evaluation. In this paper, the method of CCD imaging for scattering laser energy density distribution measurement in optical extinctive chambers was shown. Firstly, the principles and setup of measurement based on CCD imaging method were studied, and the model of scattering laser energy density measurement was simplified under special conditions. And then, the calibration process between the region division and the FOV (field of view) of CCD was described simply, the relationship between the gray value and laser energy density was found. Finally, the scattering laser energy density distribution in optical extinctive chambers was deduced by the measurement of the CCD’s gray value, and measurement errors were also analyzed.

Paper Details

Date Published: 25 October 2016
PDF: 8 pages
Proc. SPIE 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices, 968618 (25 October 2016); doi: 10.1117/12.2241798
Show Author Affiliations
Weiwei Liang, Luoyang Electronic Equipment Test Ctr. (China)
Wenpan Zhang, Luoyang Electronic Equipment Test Ctr. (China)
Qianrong Cheng, Luoyang Electronic Equipment Test Ctr. (China)
Yongwang Hao, Luoyang Electronic Equipment Test Ctr. (China)
Hongpeng Zhao, Luoyang Electronic Equipment Test Ctr. (China)


Published in SPIE Proceedings Vol. 9686:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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