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Proceedings Paper

High-resolution radiography of thick steel objects using an all-laser-driven MeV-energy x-ray source
Author(s): Daniel Haden; Shouyuan Chen; Baozhen Zhao; Ping Zhang; Grigory Golovin; Wenchao Yan; Colton Fruhling; Sudeep Banerjee; Donald Umstadter
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Paper Abstract

The recent development of a high-brightness MeV-photon source based on inverse-Compton scattering (ICS) has opened up exciting new possibilities for high-resolution radiography of dense objects. The x-ray beam is extremely bright, micron-source size, with mrad divergence, and high-spectral density, which makes it ideal for studies where high-resolution is required. The x-ray source is tunable over a wide range of parameters and we will discuss how the adjustable source parameters affect both transverse and longitudinal resolution. We then present results on the radiography of a thick steel object using this ICS source, and demonstrate the capabilities of this source with respect to operation at high photon energy while providing high spatial resolution.

Paper Details

Date Published: 16 September 2016
PDF: 9 pages
Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 99640G (16 September 2016); doi: 10.1117/12.2241606
Show Author Affiliations
Daniel Haden, Univ. of Nebraska-Lincoln (United States)
Shouyuan Chen, Univ. of Nebraska-Lincoln (United States)
Baozhen Zhao, Univ. of Nebraska-Lincoln (United States)
Ping Zhang, Univ. of Nebraska-Lincoln (United States)
Grigory Golovin, Univ. of Nebraska-Lincoln (United States)
Wenchao Yan, Univ. of Nebraska-Lincoln (United States)
Colton Fruhling, Univ. of Nebraska-Lincoln (United States)
Sudeep Banerjee, Univ. of Nebraska-Lincoln (United States)
Donald Umstadter, Univ. of Nebraska-Lincoln (United States)


Published in SPIE Proceedings Vol. 9964:
Advances in Laboratory-based X-Ray Sources, Optics, and Applications V
Ali M. Khounsary; Gert E. van Dorssen, Editor(s)

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