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Proceedings Paper

Performance evaluation of laser line scanner for in-process inspection of 3D geometries
Author(s): Sen Zhou; Jian Xu; Lei Tao; Yu Yan
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Paper Abstract

Non-contact measurement techniques using laser scanning have the power to deliver tremendous benefits to most notably manufacturing, and have the advantage of high speed and high detail output. However, a major obstacle to their widespread adoption in more complex on-line producing environments is their geometric constraints and low accuracy compared to the contact-based counterparts. The work presented in this paper introduces a performance evaluation test of laser line scanning for in-process inspection of 3D geometries. Some straightforward test methods that use a designed artifact are proposed. First, one work aims to experimentally investigate the location accuracy of knee point or corner point of edge features using a commercial laser stripe scanner, which is common in mechanical parts. Another work experimentally investigates the formation of outliers that may be usually promoted by reflective surfaces around surrounding area of corner point, and these outliers are characterized with large measurement errors, which significantly deteriorate the quality of the scanned point cloud data. Scanning path planning and outlier filter design are respectively discussed.

Paper Details

Date Published: 27 September 2016
PDF: 6 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96843K (27 September 2016); doi: 10.1117/12.2241357
Show Author Affiliations
Sen Zhou, Chongqing Academy of Metrology and Quality Inspection (China)
Chongqing Univ. (China)
Jian Xu, Chongqing Academy of Metrology and Quality Inspection (China)
Lei Tao, Chongqing Academy of Metrology and Quality Inspection (China)
Yu Yan, Chongqing Academy of Metrology and Quality Inspection (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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