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Proceedings Paper

A three axis turntable's online initial state measurement method based on the high-accuracy laser gyro SINS
Author(s): Chunfeng Gao; Guo Wei; Qi Wang; Zhenyu Xiong; Qun Wang; Xingwu Long
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Paper Abstract

As an indispensable equipment in inertial technology tests, the three-axis turntable is widely used in the calibration of various types inertial navigation systems (INS). In order to ensure the calibration accuracy of INS, we need to accurately measure the initial state of the turntable. However, the traditional measuring method needs a lot of exterior equipment (such as level instrument, north seeker, autocollimator, etc.), and the test processing is complex, low efficiency. Therefore, it is relatively difficult for the inertial measurement equipment manufacturers to realize the self-inspection of the turntable. Owing to the high precision attitude information provided by the laser gyro strapdown inertial navigation system (SINS) after fine alignment, we can use it as the attitude reference of initial state measurement of three-axis turntable. For the principle that the fixed rotation vector increment is not affected by measuring point, we use the laser gyro INS and the encoder of the turntable to provide the attitudes of turntable mounting plat. Through this way, the high accuracy measurement of perpendicularity error and initial attitude of the three-axis turntable has been achieved.

Paper Details

Date Published: 21 October 2016
PDF: 9 pages
Proc. SPIE 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII, 998714 (21 October 2016); doi: 10.1117/12.2241255
Show Author Affiliations
Chunfeng Gao, National Univ. of Defense Technology (China)
Guo Wei, National Univ. of Defense Technology (China)
Qi Wang, National Univ. of Defense Technology (China)
Zhenyu Xiong, National Univ. of Defense Technology (China)
Qun Wang, National Univ. of Defense Technology (China)
Xingwu Long, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 9987:
Electro-Optical and Infrared Systems: Technology and Applications XIII
David A. Huckridge; Reinhard Ebert; Stephen T. Lee, Editor(s)

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