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Proceedings Paper

Simulation tools for analyzer-based x-ray phase contrast imaging system with a conventional x-ray source
Author(s): Oriol Caudevilla; Wei Zhou; Stanislav Stoupin; Boris Verman; J. G. Brankov
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Paper Abstract

Analyzer-based X-ray phase contrast imaging (ABI) belongs to a broader family of phase-contrast (PC) X-ray imaging modalities. Unlike the conventional X-ray radiography, which measures only X-ray absorption, in PC imaging one can also measures the X-rays deflection induced by the object refractive properties. It has been shown that refraction imaging provides better contrast when imaging the soft tissue, which is of great interest in medical imaging applications. In this paper, we introduce a simulation tool specifically designed to simulate the analyzer-based X-ray phase contrast imaging system with a conventional polychromatic X-ray source. By utilizing ray tracing and basic physical principles of diffraction theory our simulation tool can predicting the X-ray beam profile shape, the energy content, the total throughput (photon count) at the detector. In addition we can evaluate imaging system point-spread function for various system configurations.

Paper Details

Date Published: 16 September 2016
PDF: 5 pages
Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 99640E (16 September 2016); doi: 10.1117/12.2241205
Show Author Affiliations
Oriol Caudevilla, Illinois Institute of Technology (United States)
Wei Zhou, Illinois Institute of Technology (United States)
Stanislav Stoupin, Argonne National Lab. (United States)
Boris Verman, Illinois Institute of Technology (United States)
J. G. Brankov, Illinois Institute of Technology (United States)


Published in SPIE Proceedings Vol. 9964:
Advances in Laboratory-based X-Ray Sources, Optics, and Applications V
Ali M. Khounsary; Gert E. van Dorssen, Editor(s)

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