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Proceedings Paper

Analysis of the variation of range parameters of thermal cameras
Author(s): Jarosław Bareła; Mariusz Kastek; Krzysztof Firmanty; Michał Krupiński
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Paper Abstract

Measured range characteristics may vary considerably (up to several dozen percent) between different samples of the same camera type. The question is whether the manufacturing process somehow lacks repeatability or the commonly used measurement procedures themselves need improvement. The presented paper attempts to deal with the aforementioned question. The measurement method has been thoroughly analyzed as well as the measurement test bed. Camera components (such as detector and optics) have also been analyzed and their key parameters have been measured, including noise figures of the entire system. Laboratory measurements are the most precise method used to determine range parameters of a thermal camera. However, in order to obtain reliable results several important conditions have to be fulfilled. One must have the test equipment capable of measurement accuracy (uncertainty) significantly better than the magnitudes of measured quantities. The measurements must be performed in a controlled environment thus excluding the influence of varying environmental conditions. The personnel must be well-trained, experienced in testing the thermal imaging devices and familiar with the applied measurement procedures. The measurement data recorded for several dozen of cooled thermal cameras (from one of leading camera manufacturers) have been the basis of the presented analysis. The measurements were conducted in the accredited research laboratory of Institute of Optoelectronics (Military University of Technology).

Paper Details

Date Published: 21 October 2016
PDF: 9 pages
Proc. SPIE 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII, 998711 (21 October 2016); doi: 10.1117/12.2241060
Show Author Affiliations
Jarosław Bareła, Military Univ. of Technology (Poland)
Mariusz Kastek, Military Univ. of Technology (Poland)
Krzysztof Firmanty, Military Univ. of Technology (Poland)
Michał Krupiński, Military Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 9987:
Electro-Optical and Infrared Systems: Technology and Applications XIII
David A. Huckridge; Reinhard Ebert; Stephen T. Lee, Editor(s)

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