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Proceedings Paper

Defect detection for end surface of ferrite magnetic tile
Author(s): Jiayuan Tao; Yuwei Wang; Keyi Wang
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Paper Abstract

A visual automatic detection method is proposed for defect detection on end surface of ferrite magnetic tile to tackle the disadvantages generated by human work which has low efficiency and unstable accuracy. Because the defects on end surface of ferrite magnetic tile with dark colors and low contrasts are negative for defect detection, uniform illumination is provided by LED light source and a dedicated optical system is designed to extract defects conveniently. The approach uses comparison of the fitting and actual edge curves to detect defects mainly with most defects located on the edge. Firstly improved adaptive median filter is used as the image preprocessing. Subsequently the appropriate threshold is calculated by Otsu algorithm based on the extreme points in the gray-level histogram to segment the preprocessing image. Then the Sobel operator can be used to extract the edge of end surface precisely. Finally through comparing the ideal fitting and actual edge curves of end surface, to detect the defects with some relevant features. Experimental results show that the proposed scheme could detect defects on the end surface of ferrite magnetic tile efficiency and accurately with 93.33% accuracy rate, 2.30% false acceptance rate and 8.45% correct rejection rate.

Paper Details

Date Published: 27 September 2016
PDF: 8 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 968420 (27 September 2016); doi: 10.1117/12.2241044
Show Author Affiliations
Jiayuan Tao, Univ. of Science and Technology of China (China)
Yuwei Wang, Univ. of Science and Technology of China (China)
Keyi Wang, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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