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Proceedings Paper

Longitudinal electron bunch diagnostics using coherent transition radiation at the IRFEL
Author(s): T. Y. Zhou; Y. L. Yang; B. G. Sun; L. L. Tang; P. Lu; Z. R. Zhou; F. F. Wu; X. Y. Liu
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Paper Abstract

A longitudinal electron bunch diagnostics system is developing to measure the longitudinal bunch charge distribution for the new IRFEL at National Synchrotron Radiation Laboratory (NSRL). We use a Martin-Puplett interferometer, which is essentially a Michelson interferometer, to measure the spectrum of the coherent transition radiation produced by electrons through a thin metallic foil. Frequency components of coherent transition radiation have a relationship with the bunch form factor, which is described by the square modulus of the Fourier transform of the bunch distribution. Then several techniques, including a Kramers-Kronig analysis, have been applied to determine the longitudinal bunch charge distribution. The details of the design and theoretical investigation will be described in this paper.

Paper Details

Date Published: 27 September 2016
PDF: 6 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 968411 (27 September 2016); doi: 10.1117/12.2240748
Show Author Affiliations
T. Y. Zhou, Univ. of Science and Technology of China (China)
Y. L. Yang, Univ. of Science and Technology of China (China)
B. G. Sun, Univ. of Science and Technology of China (China)
L. L. Tang, Univ. of Science and Technology of China (China)
P. Lu, Univ. of Science and Technology of China (China)
Z. R. Zhou, Univ. of Science and Technology of China (China)
F. F. Wu, Univ. of Science and Technology of China (China)
X. Y. Liu, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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