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Proceedings Paper

Measurements on semiconductor and scintillator detectors at the Advanced Light Source (Conference Presentation)
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Paper Abstract

During the transition period between closure of Beamline X27B at BNL’s NSLS and the opening of Beamline MID at NSLS-II, we began operation of LBNL’s ALS Beamline 3.3.2 to carry out our radiation detection materials RD. Measurements performed at this Beamline include, X-ray Detector Response Mapping and White Beam X-ray Diffraction Topography (WBXDT), among others. We will introduce the capabilities of the Beamline and present the most recent results obtained on CdZnTe and scintillators. The goal of the studies on CdZnTe is to understand the origin and effects of subgrain boundaries and help to visualize the presence of a higher concentration of impurities, which might be responsible for the deterioration of the energy resolution and response uniformity in the vicinity of the sub-grain boundaries. The results obtained in the second year of measurements will be presented.

Paper Details

Date Published: 2 November 2016
PDF: 1 pages
Proc. SPIE 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, 996810 (2 November 2016); doi: 10.1117/12.2240169
Show Author Affiliations
Giuseppe S. Camarda, Brookhaven National Lab. (United States)
Aleksey E. Bolotnikov, Brookhaven National Lab. (United States)
Yonggang Cui, Brookhaven National Lab. (United States)
Rubi Gul, Brookhaven National Lab. (United States)
Anwar Hossain, Brookhaven National Lab. (United States)
Utpal N. Roy, Brookhaven National Lab. (United States)
Ge Yang, Brookhaven National Lab. (United States)
Ralph B. James, Brookhaven National Lab. (United States)
Peter E. Vanier, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 9968:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII
Ralph B. James; Michael Fiederle; Arnold Burger; Larry Franks, Editor(s)

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