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Proceedings Paper

EPICS-based control and data acquisition for the APS slope profiler (Conference Presentation)
Author(s): Joseph Sullivan; Lahsen Assoufid; Jun Qian; Peter R. Jemian; Tim Mooney; Mark L. Rivers; Kurt Goetze; Ronald L. Sluiter; Keenan Lang

Paper Abstract

The motion control, data acquisition and analysis system for APS Slope Measuring Profiler was implemented using the Experimental Physics and Industrial Control System (EPICS). EPICS was designed as a framework with software tools and applications that provide a software infrastructure used in building distributed control systems to operate devices such as particle accelerators, large experiments and major telescopes. EPICS was chosen to implement the APS Slope Measuring Profiler because it is also applicable to single purpose systems. The control and data handling capability available in the EPICS framework provides the basic functionality needed for high precision X-ray mirror measurement. Those built in capabilities include hardware integration of high-performance motion control systems (3-axis gantry and tip-tilt stages), mirror measurement devices (autocollimator, laser spot camera) and temperature sensors. Scanning the mirror and taking measurements was accomplished with an EPICS feature (the sscan record) which synchronizes motor positioning with measurement triggers and data storage. Various mirror scanning modes were automatically configured using EPICS built-in scripting. EPICS tools also provide low-level image processing (areaDetector). Operation screens were created using EPICS-aware GUI screen development tools.

Paper Details

Date Published: 2 November 2016
PDF: 1 pages
Proc. SPIE 9962, Advances in Metrology for X-Ray and EUV Optics VI, 996205 (2 November 2016); doi: 10.1117/12.2240118
Show Author Affiliations
Joseph Sullivan, Argonne National Lab. (United States)
Lahsen Assoufid, Argonne National Lab. (United States)
Jun Qian, Argonne National Lab. (United States)
Peter R. Jemian, Argonne National Lab. (United States)
Tim Mooney, Argonne National Lab. (United States)
Mark L. Rivers, The Univ. of Chicago (United States)
Kurt Goetze, Argonne National Lab. (United States)
Ronald L. Sluiter, Argonne National Lab. (United States)
Keenan Lang, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 9962:
Advances in Metrology for X-Ray and EUV Optics VI
Lahsen Assoufid; Haruhiko Ohashi; Anand Krishna Asundi, Editor(s)

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