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Proceedings Paper

Quality assessment for spectral imaging
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Paper Abstract

Recent research in the area of image quality assessment has been focusing almost exclusively on greyscale and color images. The advent of technologies such as remote sensing, biomedical and industrial imaging however demands this research to be extended to multi/hyper spectral images. Spectral imaging has more judging essentials than greyscale or color imaging and its image quality assessment task intends to cover up all-around evaluating factors. This paper presents an integrating spectral imaging quality assessment project, in which spectral-based, spatial-based and radiometric-based quality evaluation behavior for one remote-sensing hyperspectral imager are jointly executed. Spectral response function is worked out and spectral performance is further judged according to its FWHM and spectral excursion value. Spatial quality assessment is worked out by MTF computing with an improved slanted edge analysis method. Radiometric response ability of different spectral channels is judged by SNR computing based upon local RMS extraction and statistics method. Improved noise elimination and parameter optimization method are adopted to improve the evaluation fidelity. This work on spectral imaging quality assessment not only has significance in the development of on-ground and in-orbit spectral imaging technique but also takes on reference value for index demonstration and design optimization for spectral instrument development.

Paper Details

Date Published: 25 October 2016
PDF: 10 pages
Proc. SPIE 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices, 96860F (25 October 2016); doi: 10.1117/12.2240101
Show Author Affiliations
Yuheng Chen, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Xinhua Chen, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Jiankang Zhou, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Yiqun Ji, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Weimin Shen, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)


Published in SPIE Proceedings Vol. 9686:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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