Share Email Print

Proceedings Paper

Mechanical properties of thin films on substrates
Author(s): Shefford P. Baker; William D. Nix
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Thin films that are used primarily for their optical, electronic, magnetic and chemical properties are not generally considered to be structural elements. Nonetheless, when thin films are auached to substrates, they are often found to support very high stresses which can cause both deformation and fracture to occur. Thus, the mechanical properties of thin films on substrates are of technological importance. In particular, the mechanical properties of optical thin films must be sufficient to insure their mechanical integrity and dimensional stability over the lifetime of the device in which they are used. The origins and consequences of internal stresses in thin films and variations in strength and stiffness from those expected of bulk materials are discussed. Two measurement techniques are presented. In the first, curvatures induced in a substrate by stresses in an attached thin film are measured to determine those stresses. The second technique involves determining the hardness and elastic modulus of a thin film while it is attached to a substrate using a depth-sensing indentation device.

Paper Details

Date Published: 1 December 1990
PDF: 14 pages
Proc. SPIE 1323, Optical Thin Films III: New Developments, (1 December 1990); doi: 10.1117/12.22398
Show Author Affiliations
Shefford P. Baker, Stanford Univ. (United States)
William D. Nix, Stanford Univ. (United States)

Published in SPIE Proceedings Vol. 1323:
Optical Thin Films III: New Developments
Richard Ian Seddon, Editor(s)

© SPIE. Terms of Use
Back to Top