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Proceedings Paper

Monitoring PMD in two-dimensional phase diagram for NRZ-DPSK systems using 0.25 bit period delay-tap sampling technique
Author(s): Xichan Zhang; Yunfeng Peng; Yumin Liu; Tonghui Ji
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Paper Abstract

Our study proposes a method of polarization mode dispersion (PMD) under the influence of optical signal-to-noise-ratio (OSNR) in the two-dimensional phase diagram, while the polarization mode dispersion (PMD) and optical signal-to-noise-ratio (OSNR) exist at the same time, using the controlling variable method. The study is based on 0.25 bit period delay sampling in NRZ-DPSK system, the range of the experimental optical signal-to-noise-ratio (OSNR) is from 10dB to 30dB, polarization mode dispersion (PMD) is from 0 to 20ps√km . The results show that the method can get the linear variation of polarization mode dispersion (PMD) in the two-dimensional phase diagram.

Paper Details

Date Published: 27 September 2016
PDF: 6 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96840N (27 September 2016); doi: 10.1117/12.2239774
Show Author Affiliations
Xichan Zhang, Univ. of Science and Technology Beijing (China)
Yunfeng Peng, Univ. of Science and Technology Beijing (China)
Yumin Liu, Univ. of Science and Technology Beijing (China)
Tonghui Ji, Univ. of Science and Technology Beijing (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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