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Proceedings Paper

Source of contamination in damage-test sample and vacuum
Author(s): T. Jitsuno; H. Murakami; S. Motokoshi; K. Mikami; T. Mikami; T. Kawasaki; J. Kawanaka; N. Miyanaga
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Paper Abstract

Contamination of optics observed in LFEX compression chamber was a critical problem for maintaining high damage threshold and high optical performance for mirrors and gratings in the vacuum environments. We conducted a study for understanding this problem, and we found important knowledge on the nature of contamination, namely materials of contaminants, source of contamination, the invasion mechanism, and removal method of contamination. We also found the samples for the damage test is easily contaminated in the storage environment. This means the optical coating accumulate contaminations even in the air. So we tested in-situ damage test in a gas flowing chamber with controlled contaminants. The degradation was time-dependent phenomena, and proportional to the vapor pressure of contaminants. Several materials were tested, and even in water vapor, the damage threshold was decreased about 10%. We also found out two methods for removing contaminations from the coatings. According to these studies, our conclusion is special treatments should be used for knowing the intrinsic damage threshold of the coatings.

Paper Details

Date Published: 9 August 2016
PDF: 8 pages
Proc. SPIE 9983, Pacific Rim Laser Damage 2016: Optical Materials for High-Power Lasers, 998316 (9 August 2016); doi: 10.1117/12.2239547
Show Author Affiliations
T. Jitsuno, Osaka Univ. (Japan)
H. Murakami, Osaka Univ. (Japan)
Promotion Ctr. of Laser Technology (Japan)
S. Motokoshi, Institute for Laser Technology (Japan)
K. Mikami, Osaka Univ. (Japan)
T. Mikami, Okamoto Optics Works, Inc. (Japan)
T. Kawasaki, Osaka Univ. (Japan)
J. Kawanaka, Osaka Univ. (Japan)
N. Miyanaga, Osaka Univ. (Japan)


Published in SPIE Proceedings Vol. 9983:
Pacific Rim Laser Damage 2016: Optical Materials for High-Power Lasers
Takahisa Jitsuno; Jianda Shao; Wolfgang Rudolph, Editor(s)

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