Share Email Print

Proceedings Paper

A new transmission x-ray microscope for in-situ nano-tomography at the APS (Conference Presentation)
Author(s): Vincent De Andrade; Alex Deriy; Michael Wojcik; Doga Gürsoy; Deming Shu; Tim Mooney; Kevin M. Peterson; Arthur Glowacki; Ke Yue; Xiaogang Yang; Rafael Vescovi; Francesco De Carlo
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new Transmission X-ray Microscope (TXM), optimized for in-situ nano-tomography experiments, has been designed and built at the Advanced Photon Source (APS). The instrument has been in operation for the last two years and is supporting users over large fields of Science, from energy storage and material science to natural sciences. The flexibility of our X-ray microscope design permits evolutionary geometries and can accommodate relatively heavy, up to 5 kg, and bulky in-situ cells while ensuring high spatial resolution, which is expected to improve steadily thanks to the support of the RD program led by the APS-Upgrade project on Fresnel zone plates (FZP). The robust sample stack, designed with minimum degrees of freedom shows a stability better than 4 nm rms at the sample location. The TXM operates with optics fabricated in-house. A spatial resolution of 30 nm per voxel has been demonstrated when the microscope operates with a 60 nm outermost zone width FZP with a measured efficiency of 18% at 8 keV. 20 nm FZP are also currently available and should be in routine use within the next few months once a new matching condenser is produced. In parallel, efficiency is being improved with opto-mechanical engineering (FZP stacking system) and software developments (more efficient reconstruction algorithms combined with different data acquisition schemes), enabling 3D dynamic studies when sample evolution occurs within a couple of tens of seconds.

Paper Details

Date Published: 2 November 2016
PDF: 1 pages
Proc. SPIE 9967, Developments in X-Ray Tomography X, 99670H (2 November 2016); doi: 10.1117/12.2239449
Show Author Affiliations
Vincent De Andrade, Argonne National Lab. (United States)
Alex Deriy, Argonne National Lab. (United States)
Michael Wojcik, Argonne National Lab. (United States)
Doga Gürsoy, Argonne National Lab. (United States)
Deming Shu, Argonne National Lab. (United States)
Tim Mooney, Argonne National Lab. (United States)
Kevin M. Peterson, Argonne National Lab. (United States)
Arthur Glowacki, Argonne National Lab. (United States)
Ke Yue, Argonne National Lab. (United States)
Xiaogang Yang, Argonne National Lab. (United States)
Rafael Vescovi, Argonne National Lab. (United States)
Francesco De Carlo, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 9967:
Developments in X-Ray Tomography X
Stuart R. Stock; Bert Müller; Ge Wang, Editor(s)

© SPIE. Terms of Use
Back to Top