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Proceedings Paper

Thermal properties of optical thin-film materials
Author(s): Donald L. Decker
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Paper Abstract

A survey of experimental methods and data for thin-film thermal conductivity and heat capacity is given. Simple microscopic theory is provided as a basis for understanding the very small values of thin-film thermal conductivity observed. Interfacial resistance effects, including some conjecture on origins, as well as applications of thermal property data are discussed. The needs for future development of this important area of investigation are summarized, and some suggestions for emphasis are provIded.

Paper Details

Date Published: 1 December 1990
PDF: 9 pages
Proc. SPIE 1323, Optical Thin Films III: New Developments, (1 December 1990); doi: 10.1117/12.22394
Show Author Affiliations
Donald L. Decker, Naval Weapons Ctr. (United States)

Published in SPIE Proceedings Vol. 1323:
Optical Thin Films III: New Developments
Richard Ian Seddon, Editor(s)

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