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Mapping near-field environments of plasmonic and 2D materials with photo-induced force imaging (Conference Presentation)
Author(s): Thejaswi U. Tumkur; Chloe Doiron; Xiao Yang; Bo Li; Dayne F. Swearer; Benjamin W. Cerjan; Peter Nordlander; Naomi J. Halas; Pulickel M. Ajayan; Emilie Ringe; Isabell Thomann
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Paper Abstract

We demonstrate the ability to map photo-induced gradient forces in materials, using a setup akin to atomic force microscopy. This technique allows for the simultaneous characterization of topographical features and optical near-fields in materials, with a high spatio-temporal resolution. We show that the near-field gradient forces can be translated onto electric fields, enabling the mapping of plasmonic hot-spots in gold nanostructures, and the resolution of sub-10 nm features in photocatalytic materials. We further show that the dispersion-sensitive nature of near-field gradient forces can be used to image and distinguish atomically thin layers of 2-D materials, with high contrast.

Paper Details

Date Published: 9 November 2016
PDF: 1 pages
Proc. SPIE 9918, Metamaterials, Metadevices, and Metasystems 2016, 99180N (9 November 2016); doi: 10.1117/12.2239395
Show Author Affiliations
Thejaswi U. Tumkur, Rice Univ. (United States)
Chloe Doiron, Rice Univ. (United States)
Xiao Yang, Rice Univ. (United States)
Bo Li, Rice Univ. (United States)
Dayne F. Swearer, Rice Univ. (United States)
Benjamin W. Cerjan, Rice Univ. (United States)
Peter Nordlander, Rice Univ. (United States)
Naomi J. Halas, Rice Univ. (United States)
Pulickel M. Ajayan, Rice Univ. (United States)
Emilie Ringe, Rice Univ. (United States)
Isabell Thomann, Rice Univ. (United States)


Published in SPIE Proceedings Vol. 9918:
Metamaterials, Metadevices, and Metasystems 2016
Nader Engheta; Mikhail A. Noginov; Nikolay I. Zheludev, Editor(s)

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Mapping near-field environments of plasmonic and 2D materials with photo-induced force imaging (Conference Presentation)



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