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Proceedings Paper

Sequential accelerated tests: Improving the correlation of accelerated tests to module performance in the field
Author(s): Thomas Felder; William Gambogi; Katherine Stika; Bao-Ling Yu; Alex Bradley; Hongjie Hu; Lucie Garreau-Iles; T. John Trout
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Paper Abstract

DuPont has been working steadily to develop accelerated backsheet tests that correlate with solar panels observations in the field. This report updates efforts in sequential testing. Single exposure tests are more commonly used and can be completed more quickly, and certain tests provide helpful predictions of certain backsheet failure modes. DuPont recommendations for single exposure tests are based on 25-year exposure levels for UV and humidity/temperature, and form a good basis for sequential test development. We recommend a sequential exposure of damp heat followed by UV then repetitions of thermal cycling and UVA. This sequence preserves 25-year exposure levels for humidity/temperature and UV, and correlates well with a large body of field observations. Measurements can be taken at intervals in the test, although the full test runs 10 months. A second, shorter sequential test based on damp heat and thermal cycling tests mechanical durability and correlates with loss of mechanical properties seen in the field. Ongoing work is directed toward shorter sequential tests that preserve good correlation to field data.

Paper Details

Date Published: 26 September 2016
PDF: 6 pages
Proc. SPIE 9938, Reliability of Photovoltaic Cells, Modules, Components, and Systems IX, 993804 (26 September 2016); doi: 10.1117/12.2239030
Show Author Affiliations
Thomas Felder, E.I. du Pont Nemours and Co. (United States)
William Gambogi, E.I. du Pont Nemours and Co. (United States)
Katherine Stika, E.I. du Pont Nemours and Co. (United States)
Bao-Ling Yu, E.I. du Pont Nemours and Co. (United States)
Alex Bradley, E.I. du Pont Nemours and Co. (United States)
Hongjie Hu, DuPont (China) Research & Development and Management Co., Ltd. (China)
Lucie Garreau-Iles, DuPont de Nemours International S.A. (Switzerland)
T. John Trout, E.I. du Pont Nemours and Co. (United States)


Published in SPIE Proceedings Vol. 9938:
Reliability of Photovoltaic Cells, Modules, Components, and Systems IX
Neelkanth G. Dhere; John H. Wohlgemuth; Keiichiro Sakurai, Editor(s)

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