
Proceedings Paper
Image-based characterization of microfocus x-ray target failureFormat | Member Price | Non-Member Price |
---|---|---|
$14.40 | $18.00 |
![]() |
GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. | Check Access |
Paper Abstract
X-ray targets in microfocus x-ray tubes fail primarily due to sublimation and evaporation of tungsten while exposed to
the electron beam. The temperature at the point of impact of the electron beam depends on the beam energy (200-300
kV), the beam current (<10 mA), the cross section (<1 mm) and the intensity profile. In order to preserve the target for a
reasonable lifetime, temperatures at the spot do not typically exceed 2500 C. As tungsten evaporates from the surface of
the target, the surface starts to pit and this can affect the x-ray production in multiple ways: the photon flux decreases,
the heel effect is enhanced, the effective spot size changes shape and/or size. Indirectly, the target damage incurred over
time or due to intense use will undermine the image quality by reducing image contrast, changing the resolution or
degrading the signal to noise ratio. A detailed description of how x-ray target damage is incurred and the potential
impact on image quality is reviewed in detail. Experimental results showing the target damage and associated loss of
image quality are discussed.
Paper Details
Date Published: 16 September 2016
PDF: 5 pages
Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 996405 (16 September 2016); doi: 10.1117/12.2238968
Published in SPIE Proceedings Vol. 9964:
Advances in Laboratory-based X-Ray Sources, Optics, and Applications V
Ali M. Khounsary; Gert E. van Dorssen, Editor(s)
PDF: 5 pages
Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 996405 (16 September 2016); doi: 10.1117/12.2238968
Show Author Affiliations
Vance S. Robinson, GE Global Research (United States)
Thomas Raber, GE Global Research (United States)
Thomas Raber, GE Global Research (United States)
William R. Ross, GE Global Research (United States)
Published in SPIE Proceedings Vol. 9964:
Advances in Laboratory-based X-Ray Sources, Optics, and Applications V
Ali M. Khounsary; Gert E. van Dorssen, Editor(s)
© SPIE. Terms of Use
