Share Email Print
cover

Proceedings Paper

Design and advancement status of the Beam Expander Testing X-ray facility (BEaTriX)
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The BEaTriX (Beam Expander Testing X-ray facility) project is an X-ray apparatus under construction at INAF/OAB to generate a broad (200´60 mm2), uniform and low-divergent X-ray beam within a small lab (6´15 m2). BEaTriX will consist of an X-ray source in the focus a grazing incidence paraboloidal mirror to obtain a parallel beam, followed by a crystal monochromation system and by an asymmetrically-cut diffracting crystal to perform the beam expansion to the desired size. Once completed, BEaTriX will be used to directly perform the quality control of focusing modules of large X-ray optics such as those for the ATHENA X-ray observatory, based on either Silicon Pore Optics (baseline) or Slumped Glass Optics (alternative), and will thereby enable a direct quality control of angular resolution and effective area on a number of mirror modules in a short time, in full X-ray illumination and without being affected by the finite distance of the X-ray source. However, since the individual mirror modules for ATHENA will have an optical quality of 3-4 arcsec HEW or better, BEaTriX is required to produce a broad beam with divergence below 1-2 arcsec, and sufficient flux to quickly characterize the PSF of the module without being significantly affected by statistical uncertainties. Therefore, the optical components of BEaTriX have to be selected and/or manufactured with excellent optical properties in order to guarantee the final performance of the system. In this paper we report the final design of the facility and a detailed performance simulation.

Paper Details

Date Published: 12 October 2016
PDF: 13 pages
Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 996304 (12 October 2016); doi: 10.1117/12.2238952
Show Author Affiliations
D. Spiga, INAF - Osservatorio Astronomico di Brera (Italy)
C. Pelliciari, INAF - Osservatorio Astronomico di Brera (Italy)
B. Salmaso, INAF - Osservatorio Astronomico di Brera (Italy)
L. Arcangeli, Media Lario S.r.l. (Italy)
G. Bianucci, Media Lario S.r.l. (Italy)
C. Ferrari, CNR-IMEM (Italy)
M. Ghigo, INAF - Osservatorio Astronomico di Brera (Italy)
G. Pareschi, INAF - Osservatorio Astronomico di Brera (Italy)
M. Rossi, Media Lario S.r.l. (Italy)
G. Tagliaferri, INAF - Osservatorio Astronomico di Brera (Italy)
G. Valsecchi, Media Lario S.r.l. (Italy)
G. Vecchi, INAF - Osservatorio Astronomico di Brera (Italy)
A. Zappettini, CNR-IMEM (Italy)


Published in SPIE Proceedings Vol. 9963:
Advances in X-Ray/EUV Optics and Components XI
Ali M. Khounsary; Shunji Goto; Christian Morawe, Editor(s)

© SPIE. Terms of Use
Back to Top