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Proceedings Paper

X-ray diffraction tomography of polycrystalline materials: present and future (Conference Presentation)
Author(s): Stuart R. Stock; Jonathan D. Almer; Henrik Birkedal
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Paper Abstract

Scattered x-radiation can be used for computed tomographic reconstruction of the distribution of crystallographic phases within the interior of specimens, and diffraction patterns can be measured for each volume element (voxel) within a reconstructed slice. This modality has been applied to systems as diverse as mineralized tissues and inorganic composites. Use of high energy x-rays (E < 40 keV) offers advantages including the ability to study volumes deep with specimens and to sample large ranges of reciprocal space, i.e., many reflections. The bases of diffraction tomography are reviewed, and the power of the technique is illustrated by the results obtained for specimens containing: a) different materials (SiC/Al composite), b) different polytypes (calcite/aragonite in a bivalve attachment system); c) mixtures of nanocrystalline and amorphous phases; d) a single phase, but volumes with different lattice parameters (hydroxyapatite, hAp, the mineral in bone and tooth); e) a single phase containing a spatial distribution of crystallographic texture (bone); a single phase with a spatial distribution of strains produced by in situ loading (bone). Finally, challenges and future directions are discussed.

Paper Details

Date Published: 2 November 2016
PDF: 1 pages
Proc. SPIE 9967, Developments in X-Ray Tomography X, 99670G (2 November 2016); doi: 10.1117/12.2238863
Show Author Affiliations
Stuart R. Stock, Northwestern Univ. (United States)
Jonathan D. Almer, Argonne National Lab. (United States)
Henrik Birkedal, Aarhus Univ. (Denmark)


Published in SPIE Proceedings Vol. 9967:
Developments in X-Ray Tomography X
Stuart R. Stock; Bert Müller; Ge Wang, Editor(s)

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