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Proceedings Paper

Intense deep blue exciplex electroluminescence from NPB/TPBi:PPh3O-based OLEDs and their intrinsic degradation mechanisms (Conference Presentation)
Author(s): Joseph Shinar; Chamika Hippola; Dusan Danilovic; Ujjal Bhattacharjee; Jacob W. Petrich; Ruth Shinar
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Paper Abstract

We describe intense and efficient deep blue (430 – 440 nm) exciplex emission from NPB/TPBi:PPh3O OLEDs where the luminous efficiency approaches 4 Cd/A and the maximal brightness exceeds 22,000 Cd/m2. Time resolved PL measurements confirm the exciplex emission from NPB:TPBi, as studied earlier by Monkman and coworkers [Adv. Mater. 25, 1455 (2013)]. However, the inclusion of PPh3O improves the OLED performance significantly. The effect of PPh3O on the EL and PL will be discussed. The NPB/TPBi:PPh3O-based OLEDs were also studied by optically and electrically detected magnetic resonance (ODMR and EDMR, respectively). In particular, the amplitude of the negative (EL- and current-quenching) spin 1/2 resonance, previously attributed to enhanced formation of strongly EL-quenching positive bipolarons, increases as the OLEDs degrade in a dry nitrogen atmosphere. This degradation mechanism is discussed in relation to degradation induced by hot polarons that are energized by exciton annihilation.

Paper Details

Date Published: 4 November 2016
PDF: 1 pages
Proc. SPIE 9941, Organic Light Emitting Materials and Devices XX, 994106 (4 November 2016); doi: 10.1117/12.2238816
Show Author Affiliations
Joseph Shinar, Iowa State Univ. of Science and Technology (United States)
Chamika Hippola, Iowa State Univ. of Science and Technology (United States)
Dusan Danilovic, Iowa State Univ. of Science and Technology (United States)
Ujjal Bhattacharjee, Iowa State Univ. of Science and Technology (United States)
Jacob W. Petrich, Iowa State Univ. of Science and Technology (United States)
Ruth Shinar, Iowa State Univ. of Science and Technology (United States)


Published in SPIE Proceedings Vol. 9941:
Organic Light Emitting Materials and Devices XX
Franky So; Chihaya Adachi; Jang-Joo Kim, Editor(s)

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