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Proceedings Paper

X-ray microtomography at Shanghai Synchrotron Radiation facility
Author(s): Rongchang Chen; Honglan Xie; Biao Deng; Guohao Du; Yuqi Ren; Yudan Wang; Guangzhao Zhou; Hai Tan; Yiming Yang; Liang Xu; Tao Hu; Qiao Li; Binggang Feng; Feixiang Wang; Tiqiao Xiao
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Paper Abstract

BL13W, an X-ray imaging beamline has been built and opened to users since May 6, 2009. More than 70 user proposals per year are granted and implemented at the beamline, with about 500 user visits/year. Up to now, X-ray microtomography (XMCT) is the dominated method for BL13W user operation, more than 70% user experiments were carried out with XMCT, covering the research fields in material science, biomedicine, physics, environmental science, archaeology and paleontology. To meet the user requirements, micro-CT imaging methods based on a variety of contrast mechanisms, including absorption, phase contrast, X-ray fluorescence, have been developed. Algorithms and related software have been developed achieve the low dose and fast data collection. Quantitative analysis to the three dimensional CT images is highly emphasized and related software for 3D information extraction with high precision and high efficiency, has been developed. Three-dimensional structure evolution has been attracting more and more attention in many scientific research fields. Two-Hertz dynamic phase contrast CT based on monochromatic SR beam was established at SSRF. The limitation of fluorescence X-ray CT from practical applications is the data-collection efficiency. The ordered-subsets expectation maximization algorithm was inducted to improve practicability of X-ray fluorescence computed tomography (XFCT), greatly. A scheme for full field XFCT was also proposed.

Paper Details

Date Published: 4 October 2016
PDF: 11 pages
Proc. SPIE 9967, Developments in X-Ray Tomography X, 99671B (4 October 2016); doi: 10.1117/12.2238785
Show Author Affiliations
Rongchang Chen, Shanghai Institute of Applied Physics (China)
Honglan Xie, Shanghai Institute of Applied Physics (China)
Biao Deng, Shanghai Institute of Applied Physics (China)
Guohao Du, Shanghai Institute of Applied Physics (China)
Yuqi Ren, Shanghai Institute of Applied Physics (China)
Yudan Wang, Shanghai Institute of Applied Physics (China)
Guangzhao Zhou, Shanghai Institute of Applied Physics (China)
Hai Tan, Shanghai Institute of Applied Physics (China)
Univ. of Chinese Academy of Sciences (China)
Yiming Yang, Shanghai Institute of Applied Physics (China)
Univ. of Chinese Academy of Sciences (China)
Liang Xu, Shanghai Institute of Applied Physics (China)
Univ. of Chinese Academy of Sciences (China)
Tao Hu, Shanghai Institute of Applied Physics (China)
Univ. of Chinese Academy of Sciences (China)
Qiao Li, Shanghai Institute of Applied Physics (China)
Univ. of Chinese Academy of Sciences (China)
Binggang Feng, Shanghai Institute of Applied Physics (China)
Univ. of Chinese Academy of Sciences (China)
Feixiang Wang, Shanghai Institute of Applied Physics (China)
Univ. of Chinese Academy of Sciences (China)
Tiqiao Xiao, Shanghai Institute of Applied Physics (China)


Published in SPIE Proceedings Vol. 9967:
Developments in X-Ray Tomography X
Stuart R. Stock; Bert Müller; Ge Wang, Editor(s)

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