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Assessments and applications of Terra and Aqua MODIS on-orbit electronic calibration
Author(s): Xiaoxiong Xiong; Na Chen; Yonghong Li; Truman Wilson
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Paper Abstract

MODIS has 36 spectral bands located on four focal plane assemblies (FPAs), covering wavelengths from 0.41 to 14.4 μm. MODIS bands 1-30 collect data using photovoltaic (PV) detectors and, therefore, are referred to as the PV bands. Similarly, bands 31-36 using photoconductive (PC) detectors are referred to as the PC bands. The MODIS instrument was built with a set of on-board calibrators (OBCs) in order to track on-orbit changes of its radiometric, spatial, and spectral characteristics. In addition, an electronic calibration (ECAL) function can be used to monitor on-orbit changes of its electronic responses (gains). This is accomplished via a series of stair step signals generated by the ECAL function. These signals, in place of the FPA detector signals, are amplified and digitized just like the detector signals. Over the entire mission of both Terra and Aqua MODIS, the ECAL has been performed for the PV bands and used to assess their on-orbit performance. This paper provides an overview of MODIS on-orbit calibration activities with a focus on the PV ECAL, including its calibration process and approaches used to monitor the electronic performance. It presents the results derived and lessons learned from Terra and Aqua MODIS on-orbit ECAL. Also discussed are some of the applications performed with the information provided by the ECAL data.

Paper Details

Date Published: 19 September 2016
PDF: 10 pages
Proc. SPIE 9972, Earth Observing Systems XXI, 99720X (19 September 2016); doi: 10.1117/12.2238603
Show Author Affiliations
Xiaoxiong Xiong, NASA Goddard Space Flight Ctr. (United States)
Na Chen, Science Systems and Applications, Inc. (United States)
Yonghong Li, Science Systems and Applications, Inc. (United States)
Truman Wilson, Science Systems and Applications, Inc. (United States)


Published in SPIE Proceedings Vol. 9972:
Earth Observing Systems XXI
James J. Butler; Xiaoxiong (Jack) Xiong; Xingfa Gu, Editor(s)

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