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Proceedings Paper

Multi-station electron scrubbing and performance testing device of large-area MCP
Author(s): Yun-sheng Qian; LiMing Tang; ChengXin Song; Jian Liu; Cheng Feng; Yijun Zhang
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Paper Abstract

Microchannel Plates(MCP) have been widely used in X-ray detection, night vision and other fields. X-ray detection used in the field of space usually requires a lot of large area of MCPs. A set of multi-station electron scrubbing and performance testing device for large area MCP is developed in this paper. Four sets of large area electron source are designed for electron scrubbing. Aiming at single MCP and dual-MCP structure, the high voltage power system, signal processing module and mechanical control structure are designed to achieve scrubbing and testing of 4 groups of large area MCP at the same time. By using this device, the scrubbing and testing of large area MCPs of 106mm in diameter are achieved. The test results are given and analyzed.

Paper Details

Date Published: 30 September 2016
PDF: 6 pages
Proc. SPIE 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, 99680K (30 September 2016); doi: 10.1117/12.2238501
Show Author Affiliations
Yun-sheng Qian, Nanjing Univ. of Science and Technology (China)
LiMing Tang, Nanjing Univ. of Science and Technology (China)
ChengXin Song, Nanjing Univ. of Science and Technology (China)
Jian Liu, Nanjing Univ. of Science and Technology (China)
Cheng Feng, Nanjing Univ. of Science and Technology (China)
Yijun Zhang, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9968:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII
Ralph B. James; Michael Fiederle; Arnold Burger; Larry Franks, Editor(s)

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