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Giant field enhancement in anisotropic epsilon-near-zero films (Conference Presentation)
Author(s): Mohammad Kamandi; Caner Guclu; Filippo Capolino
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Paper Abstract

We investigated anisotropic epsilon-near-zero (AENZ) films under TM-polarized plane wave incidence and found they possess peculiar properties. In particular we studied uniaxially anisotropic films where either the permittivity along the surface normal or along the transverse plane tends to zero while the other one does not. Previously, numerous applications of isotropic epsilon-near-zero (ENZ) films including radiation pattern tailoring, enhanced harmonic generation, optical bistability and energy squeezing have been studied. A notable property of these materials is the capability of enhancing electric field. In this paper the capability of AENZ films in local electric field enhancement has been quantified and several AENZ conditions are reported with superior performance in comparison to (isotropic) ENZ films. Specifically, sensitivity to film thickness and losses, and the range of angles of incidence have been elaborated with the aim of achieving large electric field enhancement in the film. It has been proved that in comparison to the (isotropic) ENZ case the AENZ film’s field enhancement is not only much larger but it also occurs for a wider range of angles of incidence. Furthermore the field enhancement in AENZ does not exhibit significant dependence on the film thickness unlike the isotropic case. The effect of loss on the value of the field enhancement is also investigated emphasizing the advantages of AENZ versus ENZ. Realization of AENZ materials can be done by a multilayered media made of a stack of conductive and insulator layers or by stacking semiconductor layers. This giant field enhancement is an important target in nonlinear optics for applications like second harmonic generation and other applications like light generation

Paper Details

Date Published: 9 November 2016
PDF: 1 pages
Proc. SPIE 9918, Metamaterials, Metadevices, and Metasystems 2016, 991821 (9 November 2016); doi: 10.1117/12.2238470
Show Author Affiliations
Mohammad Kamandi, Univ. of California, Irvine (United States)
Caner Guclu, Univ. of California, Irvine (United States)
Filippo Capolino, Univ. of California, Irvine (United States)


Published in SPIE Proceedings Vol. 9918:
Metamaterials, Metadevices, and Metasystems 2016
Nader Engheta; Mikhail A. Noginov; Nikolay I. Zheludev, Editor(s)

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