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Proceedings Paper

How to align a new detector and micro shutter inside JWST’s Near Infrared Spectrograph (NIRSpec)
Author(s): Maurice te Plate; Peter Rumler; Peter Jensen; Robert Eder; Ralf Ehrenwinkler; Frank Merkle; Andreas Roedel; Max Speckmaier; Thomas E. Johnson; Brent Mott; Stephen Snodgrass; Chris Gunn; Justin Ward
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Paper Abstract

JWST will be the biggest space telescope ever built and it will lead to astounding scientific breakthroughs. The mission will be launched in October 2018 from Kourou, French Guyana by an ESA provided Ariane 5 rocket. NIRSpec, one of the four instruments on board of the mission, recently underwent a major upgrade. New infrared detectors were installed and the Micro Shutter Assembly (MSA) was replaced as well. The rework was necessary because both systems were found to be degrading beyond a level that could be accepted. The installation and “in situ” alignment of these new systems required special techniques and alignment jigs that will be described in this paper. Some first results will be presented as well.

Paper Details

Date Published: 27 September 2016
PDF: 11 pages
Proc. SPIE 9951, Optical System Alignment, Tolerancing, and Verification X, 99510F (27 September 2016); doi: 10.1117/12.2238386
Show Author Affiliations
Maurice te Plate, European Space Agency (United States)
Peter Rumler, European Space Agency (Netherlands)
Peter Jensen, European Space Agency (Netherlands)
Robert Eder, Airbus Defence and Space (Germany)
Ralf Ehrenwinkler, Airbus Defence and Space (Germany)
Frank Merkle, Airbus Defence and Space (Germany)
Andreas Roedel, Airbus Defence and Space (Germany)
Max Speckmaier, Airbus Defence and Space (Germany)
Thomas E. Johnson, NASA Goddard Space Flight Ctr. (United States)
Brent Mott, NASA Goddard Space Flight Ctr. (United States)
Stephen Snodgrass, NASA Goddard Space Flight Ctr. (United States)
Chris Gunn, NASA Goddard Space Flight Ctr. (United States)
Justin Ward, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 9951:
Optical System Alignment, Tolerancing, and Verification X
José Sasián; Richard N. Youngworth, Editor(s)

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