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Proceedings Paper

Matrix methods for reflective inverse diffusion
Author(s): Kenneth W. Burgi; Michael A. Marciniak; Stephen E. Nauyoks; Mark E. Oxley
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Paper Abstract

Reflective inverse diffusion is a method of refocusing light scattered by a rough surface. An SLM is used to shape the wavefront of a HeNe laser at 632.8-nm wavelength to produce a converging phase front after reflection. Iterative methods previously demonstrated intensity enhancements of the focused spot over 100 times greater than the surrounding background speckle. This proof-of-concept method was very time consuming and the algorithm started over each time the desired location of the focus spot in the observation plane was moved. Transmission matrices have been developed to control light scattered by transmission through a turbid media. Time varying phase maps are applied to an SLM and used to interrogate the phase scattering properties of the material. For each phase map, the resultant speckle intensity pattern is recorded less than 1 mm from the material surface and represents an observation plane of less than 0.02 mm2. Fourier transforms are used to extract the phase scattering properties of the material from the intensity measurements. We investigate the effectiveness this method for constructing the reflection matrix (RM) of a diffuse reflecting medium where the propagation distances and observation plane are almost 1,000 times greater than the previous work based on transmissive scatter. The RM performance is based on its ability to refocus reflectively scattered light to a single focused spot or multiple foci in the observation plane. Diffraction-based simulations are used to corroborate experimental results.

Paper Details

Date Published: 26 September 2016
PDF: 13 pages
Proc. SPIE 9961, Reflection, Scattering, and Diffraction from Surfaces V, 99610O (26 September 2016); doi: 10.1117/12.2238272
Show Author Affiliations
Kenneth W. Burgi, Air Force Institute of Technology (United States)
Michael A. Marciniak, Air Force Institute of Technology (United States)
Stephen E. Nauyoks, Air Force Institute of Technology (United States)
Mark E. Oxley, Air Force Institute of Technology (United States)


Published in SPIE Proceedings Vol. 9961:
Reflection, Scattering, and Diffraction from Surfaces V
Leonard M. Hanssen, Editor(s)

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