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Proceedings Paper

Aberration analysis based on pinhole-z-scan method near the focal point of refractive systems
Author(s): Pablo Castro-Marín; Jesús Garduño-Mejía; Martha Rosete-Aguilar; Neil C. Bruce; Derryck T. Reid; C. Farrell; Gabriel E. Sandoval-Romero
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Paper Abstract

In this work we present a method used to study the spherical and chromatic aberrations contribution near the focal point of a refractive optical system. The actual focal position is measured by scanning a pinhole attached on the front of a power detector, which are scanned along the optical axis using a motorized stage with 1 μm resolution. Spherical aberration contribution was analyzed by changing the pupil aperture, by modifying the size of the input iris diaphragm and for each case, measuring the actual laser power vs the detector position. Chromatic aberration was analyzed by performing the same procedure but in this case we used an ultra-broad-band femtosecond laser. The results between ML and CW operation were compare. Experimental results are presented.

Paper Details

Date Published: 27 September 2016
PDF: 6 pages
Proc. SPIE 9953, Optical Modeling and Performance Predictions VIII, 99530Q (27 September 2016); doi: 10.1117/12.2238239
Show Author Affiliations
Pablo Castro-Marín, Univ. Nacional Autónoma de México (Mexico)
Jesús Garduño-Mejía, Univ. Nacional Autónoma de México (Mexico)
Martha Rosete-Aguilar, Univ. Nacional Autónoma de México (Mexico)
Neil C. Bruce, Univ. Nacional Autónoma de México (Mexico)
Derryck T. Reid, Heriot-Watt Univ. (United Kingdom)
C. Farrell, Heriot-Watt Univ. (United Kingdom)
Gabriel E. Sandoval-Romero, Univ. Nacional Autónoma de México (Mexico)


Published in SPIE Proceedings Vol. 9953:
Optical Modeling and Performance Predictions VIII
Mark A. Kahan; Marie B. Levine-West, Editor(s)

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