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Bent diamond-crystal x-ray spectrographs for x-ray free-electron laser noninvasive diagnostics
Author(s): Sergey Terentyev; Vladimir Blank; Tomasz Kolodziej; Yuri Shvyd'ko
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Paper Abstract

We report on the manufacturing and X-ray tests of bent diamond-crystal X-ray spectrographs, designed for noninvasive diagnostics of the X-ray free-electron laser (XFEL) spectra in the spectral range from 5 to 15 keV. The key component is a curved, 20-μm thin, single crystalline diamond triangular plate in the (110) orientation. The radius of curvature can be varied between R = 0:6 m and R = 0:1 m in a controlled fashion, ensuring imaging in a spectral window of up to 60 eV for ~ 8 keV X-rays. All of the components of the bending mechanism (about 10 parts) are manufactured from diamond, thus ensuring safe operations in intense XFEL beams. The spectrograph is transparent to 88% for 5-keV photons, and to 98% for 15-keV photons. Therefore, it can be used for noninvasive diagnostics of the X-ray spectra during XFEL operations.

Paper Details

Date Published: 15 September 2016
PDF: 10 pages
Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 99630B (15 September 2016); doi: 10.1117/12.2238006
Show Author Affiliations
Sergey Terentyev, Technological Institute of Superhard and New Carbon Materials (Russian Federation)
Vladimir Blank, Technological Institute of Superhard and New Carbon Materials (Russian Federation)
Tomasz Kolodziej, Argonne National Lab. (United States)
Yuri Shvyd'ko, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 9963:
Advances in X-Ray/EUV Optics and Components XI
Ali M. Khounsary; Shunji Goto; Christian Morawe, Editor(s)

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Bent diamond-crystal x-ray spectrographs for x-ray free-electron laser noninvasive diagnostics



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