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Proceedings Paper

Refractive index measurements of Ge
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Paper Abstract

A program has been started at NIST to make high-accuracy measurements of the infrared (IR) index properties of technologically important IR materials, in order to provide the IR optics community with updated values for the highest quality materials now available. For this purpose, we designed and built a minimum-deviation-angle refractometry system enabling diffraction-limited index measurements for wavelengths from 0.12 μm to 14 μm. We discuss the apparatus and procedures that we use for IR measurements. First results are presented for germanium for the wavelength range from 2 μm to 14 μm, with standard uncertainties ranging from 2 × 10-5 near 2 μm to 8 × 10-5 near 14 μm. This is an improvement by about an order of magnitude of the uncertainty level for index data of germanium generally used for optic design. A Sellmeier formula fitting our data for this range is provided. An analysis of the uncertainty is presented in detail. These measurements are compared to previous measurements of Ge.

Paper Details

Date Published: 20 September 2016
PDF: 11 pages
Proc. SPIE 9974, Infrared Sensors, Devices, and Applications VI, 99740X (20 September 2016); doi: 10.1117/12.2237978
Show Author Affiliations
John H. Burnett, National Institute of Standards and Technology (United States)
Simon G. Kaplan, National Institute of Standards and Technology (United States)
Eric Stover, M3 Measurement Solutions, Inc. (United States)
Adam Phenis, AMP Optics (United States)


Published in SPIE Proceedings Vol. 9974:
Infrared Sensors, Devices, and Applications VI
Paul D. LeVan; Ashok K. Sood; Priyalal Wijewarnasuriya; Arvind I. D'Souza, Editor(s)

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Refractive index measurements of Ge



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