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Proceedings Paper

An automatic registration system of multi-view 3D measurement data using two-axis turntables
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Paper Abstract

Automatic registration is a key researcher issue in 3D measurement field. In this work, we developed the automatic registration system, which is composed of a stereo system with structured light and two axis turntables. To realize the fully automatically 3D point registration, the novel method is proposed for calibration the stereo system and the two turntable direction vector simultaneously. The plane calibration rig with marked points was placed on the turntable and was captured by the left and right cameras of the stereo system with different rotation angles of the two axis turntable. By the shot images, a stereo system (intrinsically and extrinsically) was calibrated with classics camera model, and reconstruction 3D coordinates of the marked points with different angle of the two turntable. The marked point in different angle posted the specific circle, and the normal line of the circle around the turntable axis direction vector. For the each turntable, different points have different circle and normal line, and the turntable axis direction vector is calculated by averaging the different normal line. And the result show that, the proposed registration system can precisely register point cloud under the different scanning angles. In addition, there are no the ICP iterative procedures, and that make it can be used in registration of the point cloud without the obvious features like sphere, cylinder comes and the other rotator.

Paper Details

Date Published: 28 September 2016
PDF: 9 pages
Proc. SPIE 9971, Applications of Digital Image Processing XXXIX, 99712H (28 September 2016); doi: 10.1117/12.2237860
Show Author Affiliations
Dong He, Shenzhen Univ. (China)
Xiaoli Liu, Shenzhen Univ. (China)
Zewei Cai, Shenzhen Univ. (China)
Hailong Chen, Shenzhen Univ. (China)
Xiang Peng, Shenzhen Univ. (China)

Published in SPIE Proceedings Vol. 9971:
Applications of Digital Image Processing XXXIX
Andrew G. Tescher, Editor(s)

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