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Black synthetic quartz glass layer for optical fiber cross-talk reduction fabricated by VAD method
Author(s): Soichi Kobayashi; Kaoru Fukuda; Gen Onishi; Yusuke Fujii
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Paper Abstract

In this report the new black-glass fiber-preform fabricated by the vapor-phase axial deposition (VAD) method to realize high-resolution optical bundle fibers is discussed with the Energy Dispersive X-ray (EDX) analysis and the transmittance spectrum measurement. The black glass consists of SiO2, GeO2, Bi2O3 and Al2O3. Firstly, the rod-shaped soot of SiO2 and GeO2 is prepared by blowing SiCl4 and GeCl4 into the oxyhydrogen burner. Then the soot is dipped into the solution of the Bi and Al compounds. After drying the soot with Bi and Al penetrated, the soot is consolidated into the glass preform by heating with the carbon heater at 1650 degrees Celsius. The diameter of the obtained preform is 10.5 mm and the black glass layer thickness is 2.6 mm located at the periphery. The Bi concentration distribution shows the content of several wt% in the black glass layer. The black glass preform is drawn into the black optical fiber being expected to make a clear image because of no light leaking from the neighboring optical fibers as compared to the conventional fiber endoscope.

Paper Details

Date Published: 27 September 2016
PDF: 6 pages
Proc. SPIE 9950, Laser Beam Shaping XVII, 99500V (27 September 2016); doi: 10.1117/12.2237666
Show Author Affiliations
Soichi Kobayashi, Chitose Institute of Science and Technology (Japan)
Kaoru Fukuda, Chitose Institute of Science and Technology (Japan)
Gen Onishi, Chitose Institute of Science and Technology (Japan)
Yusuke Fujii, Photonic Science and Technology, Inc. (Japan)


Published in SPIE Proceedings Vol. 9950:
Laser Beam Shaping XVII
Andrew Forbes; Todd E. Lizotte, Editor(s)

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