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Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources
Author(s): A. Hipp; J. Herzen; J. U. Hammel; P. Lytaev; A. Schreyer; F. Beckmann
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Paper Abstract

Synchrotron X-ray imaging is constantly achieving higher spatial resolution. In the field of grating-based phase- contrast imaging, these developments allow to directly resolve the interference patterns created by a phase grating without need for a analyzer grating. In this study we analyzed the performance of a single-grating interferometer and compared it to a conventional double-grating interferometer. Based on simulations and measurements of a test phantom we evaluated the sensitivity, resolution and signal to noise ratios of different setup configurations.

Paper Details

Date Published: 3 October 2016
PDF: 7 pages
Proc. SPIE 9967, Developments in X-Ray Tomography X, 996718 (3 October 2016); doi: 10.1117/12.2237582
Show Author Affiliations
A. Hipp, Helmholtz-Zentrum Geesthacht (Germany)
J. Herzen, Technische Univ. München (Germany)
J. U. Hammel, Helmholtz-Zentrum Geesthacht (Germany)
P. Lytaev, Helmholtz-Zentrum Geesthacht (Germany)
A. Schreyer, European Spallation Source (Sweden)
F. Beckmann, Helmholtz-Zentrum Geesthacht (Germany)


Published in SPIE Proceedings Vol. 9967:
Developments in X-Ray Tomography X
Stuart R. Stock; Bert Müller; Ge Wang, Editor(s)

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