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Proposed new damp heat test standards for commercial CIGS modules with bias application or light irradiation
Author(s): Keiichiro Sakurai; Hiroshi Tomita; Kinichi Ogawa; Darshan Schmitz; Hajime Shibata; Shuuji Tokuda; Atsushi Masuda
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Paper Abstract

Based on our results that conventional damp-heat (DDH) test on a commercial CCIGS (a.k.a. CCIS, CIGSS) module causes an irreversible "Test-specific" degradation (TSD) that is not observed in modules deployed in fields, we propose a new option for DDH testing of CIGS modules. We have tested full-size CIGS modules with/without forward bias, light irradiation and humidity during heat tests. The results clearly show that adding forward bias, or white light irradiation during DH tests suppresses this irreversible degradation. Based on these results, we have proposed to add forward bias and/or light irradiation during DH tests of CIGS modules, to make the test condition closer to real fields and suppress degradations not observed in the field.

Paper Details

Date Published: 26 September 2016
PDF: 4 pages
Proc. SPIE 9938, Reliability of Photovoltaic Cells, Modules, Components, and Systems IX, 99380A (26 September 2016); doi: 10.1117/12.2237431
Show Author Affiliations
Keiichiro Sakurai, National Institute of Advanced Industrial Science and Technology (Japan)
Hiroshi Tomita, Solar Frontier K.K. (Japan)
Kinichi Ogawa, National Institute of Advanced Industrial Science and Technology (Japan)
Darshan Schmitz, Solar Frontier K.K. (Japan)
Hajime Shibata, National Institute of Advanced Industrial Science and Technology (Japan)
Shuuji Tokuda, Solar Frontier K.K. (Japan)
Atsushi Masuda, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 9938:
Reliability of Photovoltaic Cells, Modules, Components, and Systems IX
Neelkanth G. Dhere; John H. Wohlgemuth; Keiichiro Sakurai, Editor(s)

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