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Extended-range AFM imaging for applications to reflectance modeling
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Paper Abstract

A technique employing a 3D morphological image-registration algorithm is demonstrated for stitching together high-resolution surface im- ages obtained with a commercial atomic-force microscope (AFM), producing 3D surface images up to 1mm long with lateral resolution ~ 100nm: These images can be applied to reflectance modeling by extracting surface parameters to be used as inputs for reflectance models, for instance the previously-published Coherence Model [BG. Hoover and VL. Gamiz, J. Opt. Soc. Am. A 23, 314 (2006)], which utilizes the surface roughness and autocorrelation derivatives in the large-roughness approximation. Surface moments estimated from extended-range AFM images demonstrate lower uncertainty at all frequencies and substantial reduction of sampling artifacts at low frequencies, enabling improved estimates of surface parameters. The autocorrelation of a nearly monoscale diffuse-gold surface is measured out to 800μm separation, and the autocorrelation of a multiscale tin surface provides parameters that verify the Coherence Model …t to the measured quasimonostatic BRDF.

Paper Details

Date Published: 27 September 2016
PDF: 10 pages
Proc. SPIE 9961, Reflection, Scattering, and Diffraction from Surfaces V, 99610R (27 September 2016); doi: 10.1117/12.2237329
Show Author Affiliations
Brian G. Hoover, Advanced Optical Technologies, Inc. (United States)
Pablo A. Reyes, Advanced Optical Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 9961:
Reflection, Scattering, and Diffraction from Surfaces V
Leonard M. Hanssen, Editor(s)

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