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Application of field dependent polynomial model
Author(s): Petr Janout; Petr Páta; Petr Skala; Karel Fliegel; Stanislav Vítek; Jan Bednář
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Paper Abstract

Extremely wide-field imaging systems have many advantages regarding large display scenes whether for use in microscopy, all sky cameras, or in security technologies. The Large viewing angle is paid by the amount of aberrations, which are included with these imaging systems. Modeling wavefront aberrations using the Zernike polynomials is known a longer time and is widely used. Our method does not model system aberrations in a way of modeling wavefront, but directly modeling of aberration Point Spread Function of used imaging system. This is a very complicated task, and with conventional methods, it was difficult to achieve the desired accuracy. Our optimization techniques of searching coefficients space-variant Zernike polynomials can be described as a comprehensive model for ultra-wide-field imaging systems. The advantage of this model is that the model describes the whole space-variant system, unlike the majority models which are partly invariant systems. The issue that this model is the attempt to equalize the size of the modeled Point Spread Function, which is comparable to the pixel size. Issues associated with sampling, pixel size, pixel sensitivity profile must be taken into account in the design. The model was verified in a series of laboratory test patterns, test images of laboratory light sources and consequently on real images obtained by an extremely wide-field imaging system WILLIAM. Results of modeling of this system are listed in this article.

Paper Details

Date Published: 27 September 2016
PDF: 9 pages
Proc. SPIE 9971, Applications of Digital Image Processing XXXIX, 99710F (27 September 2016); doi: 10.1117/12.2237310
Show Author Affiliations
Petr Janout, Czech Technical Univ. in Prague (Czech Republic)
Petr Páta, Czech Technical Univ. in Prague (Czech Republic)
Petr Skala, Czech Technical Univ. in Prague (Czech Republic)
Karel Fliegel, Czech Technical Univ. in Prague (Czech Republic)
Stanislav Vítek, Czech Technical Univ. in Prague (Czech Republic)
Jan Bednář, Czech Technical Univ. in Prague (Czech Republic)


Published in SPIE Proceedings Vol. 9971:
Applications of Digital Image Processing XXXIX
Andrew G. Tescher, Editor(s)

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