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Proceedings Paper

X-ray induced chemical reaction revealed by in-situ X-ray diffraction and scanning X-ray microscopy in 15 nm resolution (Conference Presentation)
Author(s): Mingyuan Ge; Wenjun Liu; David Bock; Vincent De Andrade; Hanfei Yan; Xiaojing Huang; Amy Marschilok; Esther Takeuchi; Huolin Xin; Yong S. Chu
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Paper Abstract

The detection sensitivity of synchrotron-based X-ray techniques has been largely improved due to the ever increasing source brightness, which have significantly advanced ex-situ and in-situ research for energy materials, such as lithium-ion batteries. However, the strong beam-matter interaction arisen from the high beam flux can significantly modify the material structure. The parasitic beam-induced effect inevitably interferes with the intrinsic material property, which brings difficulties in interpreting experimental results, and therefore requires comprehensive evaluation. Here we present a quantitative in-situ study of the beam-effect on one electrode material Ag2VO2PO4 using four different X-ray probes with different radiation dose rate. The material system we reported exhibits interesting and reversible radiation-induced thermal and chemical reactions, which was further evaluated under electron microscopy to illustrate the underlying mechanism. The work we presented here will provide a guideline in using synchrotron X-rays to distinguish the materials’ intrinsic behavior from extrinsic structure changed induced by X-rays, especially in the case of in-situ and operando study where the materials are under external field of either temperature or electric field.

Paper Details

Date Published: 3 November 2016
PDF: 1 pages
Proc. SPIE 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII, 99270H (3 November 2016); doi: 10.1117/12.2237229
Show Author Affiliations
Mingyuan Ge, Brookhaven National Lab. (United States)
Wenjun Liu, Argonne National Lab. (United States)
David Bock, Stony Brook Univ. (United States)
Vincent De Andrade, Argonne National Lab. (United States)
Hanfei Yan, Brookhaven National Lab. (United States)
Xiaojing Huang, Brookhaven National Lab. (United States)
Amy Marschilok, Stony Brook Univ. (United States)
Esther Takeuchi, Stony Brook Univ. (United States)
Huolin Xin, Brookhaven National Lab. (United States)
Yong S. Chu, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 9927:
Nanoengineering: Fabrication, Properties, Optics, and Devices XIII
Eva M. Campo; Elizabeth A. Dobisz; Louay A. Eldada, Editor(s)

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