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X-ray echo spectroscopy (Conference Presentation)
Author(s): Yuri V. Shvyd'ko
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Paper Abstract

X-ray echo spectroscopy, a counterpart of neutron spin-echo, was recently introduced [1] to overcome limitations in spectral resolution and weak signals of the traditional inelastic x-ray scattering (IXS) probes. An image of a point-like x-ray source is defocused by a dispersing system comprised of asymmetrically cut specially arranged Bragg diffracting crystals. The defocused image is refocused into a point (echo) in a time-reversal dispersing system. If the defocused beam is inelastically scattered from a sample, the echo signal acquires a spatial distribution, which is a map of the inelastic scattering spectrum. The spectral resolution of the echo spectroscopy does not rely on the monochromaticity of the x-rays, ensuring strong signals along with a very high spectral resolution. Particular schemes of x-ray echo spectrometers for 0.1-meV and 0.02-meV ultra-high-resolution IXS applications (resolving power > 10^8) with broadband ~5-13 meV dispersing systems will be presented featuring more than 1000-fold signal enhancement. The technique is general, applicable in different photon frequency domains.\\ [1.] Yu. Shvyd’ko, Phys. Rev. Lett. 116, accepted (2016), arXiv:1511.01526.

Paper Details

Date Published: 2 November 2016
PDF: 1 pages
Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 996309 (2 November 2016); doi: 10.1117/12.2237155
Show Author Affiliations
Yuri V. Shvyd'ko, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 9963:
Advances in X-Ray/EUV Optics and Components XI
Ali M. Khounsary; Shunji Goto; Christian Morawe, Editor(s)

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X-ray echo spectroscopy (Conference Presentation)



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