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Broadband radiometric LED measurements
Author(s): G. P. Eppeldauer; C. C. Cooksey; H. W. Yoon; L. M. Hanssen; V. B. Podobedov; R. E. Vest; U. Arp; C. C. Miller
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Paper Abstract

At present, broadband radiometric LED measurements with uniform and low-uncertainty results are not available. Currently, either complicated and expensive spectral radiometric measurements or broadband photometric LED measurements are used. The broadband photometric measurements are based on the CIE standardized V(λ) function, which cannot be used in the UV range and leads to large errors when blue or red LEDs are measured in its wings, where the realization is always poor. Reference irradiance meters with spectrally constant response and high-intensity LED irradiance sources were developed here to implement the previously suggested broadband radiometric LED measurement procedure [1, 2]. Using a detector with spectrally constant response, the broadband radiometric quantities of any LEDs or LED groups can be simply measured with low uncertainty without using any source standard. The spectral flatness of filtered-Si detectors and low-noise pyroelectric radiometers are compared. Examples are given for integrated irradiance measurement of UV and blue LED sources using the here introduced reference (standard) pyroelectric irradiance meters. For validation, the broadband measured integrated irradiance of several LED-365 sources were compared with the spectrally determined integrated irradiance derived from an FEL spectral irradiance lamp-standard. Integrated responsivity transfer from the reference irradiance meter to transfer standard and field UV irradiance meters is discussed.

Paper Details

Date Published: 7 September 2016
PDF: 15 pages
Proc. SPIE 9954, Fifteenth International Conference on Solid State Lighting and LED-based Illumination Systems, 99540J (7 September 2016); doi: 10.1117/12.2237033
Show Author Affiliations
G. P. Eppeldauer, National Institute of Standards and Technology (United States)
C. C. Cooksey, National Institute of Standards and Technology (United States)
H. W. Yoon, National Institute of Standards and Technology (United States)
L. M. Hanssen, National Institute of Standards and Technology (United States)
V. B. Podobedov, National Institute of Standards and Technology (United States)
R. E. Vest, National Institute of Standards and Technology (United States)
U. Arp, National Institute of Standards and Technology (United States)
C. C. Miller, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 9954:
Fifteenth International Conference on Solid State Lighting and LED-based Illumination Systems
Matthew H. Kane; Nikolaus Dietz; Ian T. Ferguson, Editor(s)

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