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Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces
Author(s): Thomas A. Germer; Martin Foldyna; Zuzana Mrazkova; Guillaume Fischer; Etienne Drahi
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Paper Abstract

Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving material characterization and inspection during manufacture. We have performed Mueller matrix bidirectional reflectance distribution function (BRDF) measurements from a variety of textured silicon surfaces. Simulations, using multiple reflection polarization ray tracing, reproduce many of the features in the data. Evidence for diffraction, however, can also be observed, suggesting that a purely ray-tracing approach is insufficient for accurately describing the scatter from these materials.

Paper Details

Date Published: 26 September 2016
PDF: 13 pages
Proc. SPIE 9961, Reflection, Scattering, and Diffraction from Surfaces V, 996107 (26 September 2016); doi: 10.1117/12.2236976
Show Author Affiliations
Thomas A. Germer, National Institute of Standards and Technology (United States)
Martin Foldyna, LPICM-CNRS (France)
Ecole Polytechnique, Univ. Paris-Saclay (France)
IPVF (France)
Zuzana Mrazkova, LPICM-CNRS (France)
Ecole Polytechnique, Univ. Paris-Saclay (France)
Technical Univ. of Ostrava (Czech Republic)
Guillaume Fischer, IPVF (France)
Etienne Drahi, IPVF (France)
TOTAL – New Energies (France)


Published in SPIE Proceedings Vol. 9961:
Reflection, Scattering, and Diffraction from Surfaces V
Leonard M. Hanssen, Editor(s)

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