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Proceedings Paper

Increased robustness and speed in low-dose phase-contrast tomography with laboratory sources
Author(s): Anna Zamir; Charlotte K. Hagen; Paul C. Diemoz; Marco Endrizzi; Fabio A. Vittoria; Luca Urbani; Paolo De Coppi; Alessandro Olivo
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Paper Abstract

In this article we discuss three different developments in Edge Illumination (EI) X-ray phase contrast imaging (XPCi), all ultimately aimed at optimising EI computed tomography (CT) for use in different environments, and for different applications. For the purpose of reducing scan times, two approaches are presented; the reverse projection" acquisition scheme which allows a continuous rotation of the sample, and the single image" retrieval algorithm, which requires only one frame for retrieval of the projected phase map. These are expected to lead to a substantial reduction of EI CT scan times, a prospect which is likely to promote the translation of EI into several applications, including clinical. The last development presented is the "modified local" phase retrieval. This retrieval algorithm is specifically designed to accurately retrieve sample properties (absorption, refraction, scattering) in cases where high-resolution scans are required in non-ideal environments. Experimental results, using both synchrotron radiation and laboratory sources, are shown for the various approaches.

Paper Details

Date Published: 4 October 2016
PDF: 10 pages
Proc. SPIE 9967, Developments in X-Ray Tomography X, 996716 (4 October 2016); doi: 10.1117/12.2236626
Show Author Affiliations
Anna Zamir, Univ. College London (United Kingdom)
Charlotte K. Hagen, Univ. College London (United Kingdom)
Paul C. Diemoz, Univ. College London (United Kingdom)
Marco Endrizzi, Univ. College London (United Kingdom)
Fabio A. Vittoria, Univ. College London (United Kingdom)
Luca Urbani, Univ. College London (United Kingdom)
Paolo De Coppi, Univ. College London (United Kingdom)
Alessandro Olivo, Univ. College London (United Kingdom)


Published in SPIE Proceedings Vol. 9967:
Developments in X-Ray Tomography X
Stuart R. Stock; Bert Müller; Ge Wang, Editor(s)

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