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Proceedings Paper

Design and implementation of precise x-ray metrology to control a 45-cm long x-ray deformable mirror
Author(s): Lisa A. Poyneer; Jaime Ruz Armendariz; Jun Feng; Weilun Chao; Jessie Jackson; James Nasiatka; Todd Decker
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Paper Abstract

Our experiments at beamline 5.3.1 of the Advanced Light Source feature a 45-cm long x-ray deformable mirror (XDM). We describe the experiment and present recent results in two areas. First, we directly image the 3 keV x-ray beam and demonstrate customized shaping of its intensity in the near field. Detailed physics simulations of the experiment agree very well with actual measurements. Second, we use a grating interferometer to measure known figure errors applied to the surface of the XDM. A relative height change on the XDM of 2.5 nm RMS is measured at an SNR of eight in single measurement. A provisional error budget analysis indicates that uncalibrated errors in the system are by far the largest component.

Paper Details

Date Published: 9 September 2016
PDF: 14 pages
Proc. SPIE 9965, Adaptive X-Ray Optics IV, 99650G (9 September 2016); doi: 10.1117/12.2236568
Show Author Affiliations
Lisa A. Poyneer, Lawrence Livermore National Lab. (United States)
Jaime Ruz Armendariz, Lawrence Livermore National Lab (United States)
Jun Feng, Lawrence Berkeley National Lab. (United States)
Weilun Chao, Lawrence Berkeley National Lab. (United States)
Jessie Jackson, Lawrence Livermore National Lab. (United States)
James Nasiatka, Lawrence Berkeley National Lab. (United States)
Todd Decker, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 9965:
Adaptive X-Ray Optics IV
Stephen L. O'Dell; Ali M. Khounsary, Editor(s)

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