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Proceedings Paper

Tolerancing, alignment and test of the Transiting Exoplanet Survey Satellite (TESS) optical assembly
Author(s): Brian Primeau; Gregory Balonek; Robert MacDonald; Michael Chrisp; Christian Chesbrough; James Andre; Kristin Clark
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Paper Abstract

The Transiting Exoplanet Survey Satellite (TESS) will carry four visible waveband seven-element refractive f/1.4 lenses, each with a 34 degree diagonal field of view. This paper describes the tolerancing, assembly and alignment methods developed during the build of the TESS Risk Reduction Unit optical system. Lens assembly tolerances were derived from a sensitivity analysis using an image quality metric customized for mission performance. The optomechanical design consists of a two-stage lens housing that provides access for active alignment of each lens using a Trioptics OptiCentric measurement system. Thermal stresses and alignment shifts are mitigated by mounting the optics with cast RTV silicone spacers into individually aligned bezels, and custom fixtures were developed to aid in RTV bonding with reduced alignment error. The lens assembly was tested interferometrically over the field of view at room temperature and results were used to successfully predict lens performance and compensator adjustments and detector shim thickness for the -75C operational temperature and pressure.

Paper Details

Date Published: 27 September 2016
PDF: 10 pages
Proc. SPIE 9951, Optical System Alignment, Tolerancing, and Verification X, 995103 (27 September 2016); doi: 10.1117/12.2235924
Show Author Affiliations
Brian Primeau, MIT Lincoln Lab. (United States)
Gregory Balonek, MIT Lincoln Lab. (United States)
Robert MacDonald, MIT Lincoln Lab. (United States)
Michael Chrisp, MIT Lincoln Lab. (United States)
Christian Chesbrough, MIT Lincoln Lab. (United States)
James Andre, MIT Lincoln Lab. (United States)
Kristin Clark, MIT Lincoln Lab. (United States)


Published in SPIE Proceedings Vol. 9951:
Optical System Alignment, Tolerancing, and Verification X
José Sasián; Richard N. Youngworth, Editor(s)

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