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Proceedings Paper

POC in the process of acquiring polarization characteristics
Author(s): Xiaojun Zhou; Ercong Cao; Guohua Gu; Weixian Qian; Wei Yang; Haiyue Zhang
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Paper Abstract

Considering the change of optical information on material surface, this paper proposes a useful notion called pixel-level optical constants (POC). Through Fresnel equations, traditional optical constants (refractive index n and extinction coefficient k ) can reflect photoelectric characteristics on material surface. Combining with Mueller calculus in polarization optics, POC can describe the distrbution of photoelectric characteristics on material surface. POC is mainly calculated by the decomposition of Mueller matrix which includes Fresnel amplitude, ratio of two orthogonal reflection coefficient component P and variation of phase difference between incident light and reflected light Δ . With the regularity of polarized light and the statistics of Mueller matrices, optical characteristics can be detailed to each pixel in POC, which will independently show the distribution of polarization characteristics on material surface. And it can also be approximately averaged to obtain traditional optical constants. So POC is significant to optical researches on material surface.

Paper Details

Date Published: 12 September 2016
PDF: 7 pages
Proc. SPIE 9970, Optics and Photonics for Information Processing X, 997014 (12 September 2016); doi: 10.1117/12.2235747
Show Author Affiliations
Xiaojun Zhou, Nanjing Univ. of Science and Technology (China)
Ercong Cao, Xi'an North Electro-optic Co., Ltd. (China)
Guohua Gu, Nanjing Univ. of Science and Technology (China)
Weixian Qian, Nanjing Univ. of Science and Technology (China)
Wei Yang, Nanjing Univ. of Science and Technology (China)
Haiyue Zhang, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9970:
Optics and Photonics for Information Processing X
Khan M. Iftekharuddin; Abdul A. S. Awwal; Mireya García Vázquez; Andrés Márquez; Mohammad A. Matin, Editor(s)

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