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Proceedings Paper

Investigation of magnetic and ferroelectric domains using cantilever-based aperture SNOM
Author(s): Yury E. Vysokikh; Artem V. Shelaev; Vasiliy I. Shevyakov; Anatoly R. Prokopov; Alexander N. Shaposhnikov; Sergey Yu. Krasnoborodko; Victor A. Bykov; Yury A. Chapligin
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Paper Abstract

We demonstrate application of combined scanning near-field optical microscopy (SNOM) and atomic force microscopy (AFM) by using hollow-pyramid cantilevers with aperture. Cantilever aperture was made by ion beam at the center of pyramid. Same probe was used for both topography and domain structure visualization of magnetic samples. Bi: YIGthin films morphology and domain structure were investigated by this method as well as by conventional magnetic force microscopy. Topography was obtained by contact and semi-contact AFM modes. Domain structure was obtained by conventional MFM (magnetic force microscopy), using silicon cantilever with magnetic coatings. Then same area was investigated by cantilever-based aperture SNOM. Samples were excited through aperture by tightly focused linearly polarized laser beam. Magneto-optical effect of the rotation of polarization plane of transmitted light depends on domain orientation. Visualization of magnetic domains was performed by detecting cross polarized component of transmitted light.

Cantilever-based aperture near-field polarization microscopy allows to obtain domain images with resolution less than 150 nm. Domain structures of several samples with different domain size from 2 μm down to 0.25 μm were investigated. SNOM map of magnetic domains provides direct information of the magnetic moment of domains unlike MFM image which provides distribution of magnetic force gradient. Moreover, non-magnetic hollow-pyramid probe prevents sample from possible disturbances by internal magnetic moment of the MFM probe. Comparison of results obtained by SNOM and conventional MFM was performed and showed good correlation. Application of cantilever-based aperture SNOM for ferroelectric domain structure visualization is also demonstrated.

Paper Details

Date Published:
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Proc. SPIE 9925, Nanoimaging and Nanospectroscopy IV, 99250V; doi: 10.1117/12.2235319
Show Author Affiliations
Yury E. Vysokikh, National Research Univ. of Electronic Technology (Russian Federation)
Artem V. Shelaev, NT-MDT Co. (Russian Federation)
Vasiliy I. Shevyakov, National Research Univ. of Electronic Technology (Russian Federation)
Anatoly R. Prokopov, V.I. Vernadsky Crimean Federal Univ. (Russian Federation)
Alexander N. Shaposhnikov, V.I. Vernadsky Crimean Federal Univ. (Russian Federation)
Sergey Yu. Krasnoborodko, National Research Univ. of Electronic Technology (Russian Federation)
Victor A. Bykov, NT-MDT Co. (Russian Federation)
Yury A. Chapligin, National Research Univ. of Electronic Technology (Russian Federation)


Published in SPIE Proceedings Vol. 9925:
Nanoimaging and Nanospectroscopy IV
Prabhat Verma; Alexander Egner, Editor(s)

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