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Proceedings Paper

Information measurement system based on the device for evaluation of optical surface quality
Author(s): Pavel Y. Izotov
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Paper Abstract

The work describes steps taken in order to create the information-measurement system based on the device for evaluation of surface cleanliness and smoothness of optical substrates. The approach used leads to the improvement the stability and accuracy of measurements. Structural changes applied to both the software and hardware of the device which allowed retrieval of better quality images during the course of measurements are designated. Problems emerged during the implementation of the system and their solutions are described.

Paper Details

Date Published: 26 March 2016
PDF: 9 pages
Proc. SPIE 9807, Optical Technologies for Telecommunications 2015, 980714 (26 March 2016); doi: 10.1117/12.2235316
Show Author Affiliations
Pavel Y. Izotov, Image Processing Systems Institute (Russian Federation)
Samara State Aerospace Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 9807:
Optical Technologies for Telecommunications 2015
Vladimir A. Andreev; Anton V. Bourdine; Vladimir A. Burdin; Oleg G. Morozov; Albert H. Sultanov, Editor(s)

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