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Proceedings Paper

Proof of concept demonstration for coherent beam pattern measurements of KID detectors
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Paper Abstract

Here we summarize the initial results from a complex field radiation pattern measurement of a kinetic inductance detector instrument. These detectors are phase insensitive and have thus been limited to scalar, or amplitude-only, beam measurements. Vector beam scans, of both amplitude and phase, double the information received in comparison to scalar beam scans. Scalar beam measurements require multiple scans at varying distances along the optical path of the receiver to fully constrain the divergence angle of the optical system and locate the primary focus. Vector scans provide this information with a single scan, reducing the total measurement time required for new systems and also limiting the influence of system instabilities. The vector scan can be taken at any point along the optical axis of the system including the near-field, which makes beam measurements possible for large systems at high frequencies where these measurements may be inconceivable to be tested in-situ. Therefore, the methodology presented here should enable common heterodyne analysis for direct detector instruments. In principle, this coherent measurement strategy allows phase dependent analysis to be performed on any direct-detect receiver instrument.

Paper Details

Date Published: 20 July 2016
PDF: 5 pages
Proc. SPIE 9914, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VIII, 99141R (20 July 2016); doi: 10.1117/12.2233760
Show Author Affiliations
Kristina K. Davis, Arizona State Univ. (United States)
Andrey M. Baryshev, SRON Netherlands Institute for Space Research (Netherlands)
Univ. of Groningen (Netherlands)
Willem Jellema, SRON Netherlands Institute for Space Research (Netherlands)
Stephen J. C. Yates, SRON Netherlands Institute for Space Research (Netherlands)
Lorenza Ferrari, SRON Netherlands Institute for Space Research (Netherlands)
Jochem J. A. Baselmans, SRON Netherlands Institute for Space Research (Netherlands)


Published in SPIE Proceedings Vol. 9914:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VIII
Wayne S. Holland; Jonas Zmuidzinas, Editor(s)

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