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Proceedings Paper

Evaluation of novel approach to deflectometry for high accuracy optics
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Paper Abstract

A deflectometrical facility was developed at Italian National Institute for Astrophysics-OAB to characterize free-form optics with shape errors within few microns rms.

Deflectometry is an interesting technique because it allows the fast characterization of free-form optics. The capabilities of deflectometry in measuring medium-high frequencies are well known, but the low frequencies error characterization is more challenging. Our facility design foresees an innovative approach based on the acquisition of multiple direct images to enhance the performance on the challenging low frequencies range.

This contribution presents the error-budget analysis of the measuring method and a study of the configuration tolerances required to allow the use of deflectometry in the realization of optical components suitable for astronomical projects with a requirement of high accuracy for the optics. As test examples we took into account mirrors for the E-ELT telescope.

Paper Details

Date Published: 22 July 2016
PDF: 10 pages
Proc. SPIE 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II, 991213 (22 July 2016); doi: 10.1117/12.2233328
Show Author Affiliations
Giorgia Sironi, INAF - Osservatorio Astronomico di Brera (Italy)
Rodolfo Canestrari, INAF - Osservatorio Astronomico di Brera (Italy)
Kashmira Tayabaly, INAF - Osservatorio Astronomico di Brera (Italy)
Politecnico di Milano (Italy)
Giovanni Pareschi, INAF - Osservatorio Astronomico di Brera (Italy)


Published in SPIE Proceedings Vol. 9912:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
Ramón Navarro; James H. Burge, Editor(s)

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